A NIT-picking analysis: Abstractness dependence of subtests correlated to their Flynn effect magnitudes
Armstrong, Elijah L.; te Nijenhuis, Jan; Woodley of Menie, Michael A.; Fernandes, Heitor B.F.; Must, Olev; Must, Aasa
Intelligence, Vol. 57 – 2016: 1 - 6
10.1016/j.intell.2016.02.009
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